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Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California / Geoffrey T. Burnham...[et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
(Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3945)

データ種別	図書
出版者	Bellingham, Wash. : SPIE
出版年	c2000
大きさ	viii, 320 p. : ill. ; 28 cm

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