Annual proceedings, reliability physics
| データ種別 | 雑誌 |
|---|---|
| 巻次年月次 | 8th (Apr. 7/10, 1970)-31st (Mar. 23/24/25, 1993) |
| 出版者 | New York, N.Y. : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers |
| 出版年 | c1971-c1993 |
| 大きさ | v. : ill. ; 28 cm |
| 雑誌巻号一覧 |
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| 書誌ID | SB00950697 |
|---|---|
| 刊行頻度 | 年刊 |
| 本文言語 | 英語 |
| 別書名 | 略タイトル:Reliab. phys キータイトル:Reliability physics |
| 変遷注記 | 継続後誌:IEEE international reliability physics proceedings / sponsored by the IEEE Electronic Devices Society and the IEEE Reliability Society |
| 一般注記 | Sponsored by: the IEEE Electron Device Group and the IEEE Reliability Group |
| 著者標目 | *Reliability Physics Symposium IEEE Electron Devices Group IEEE Reliability Group |
| 件 名 | LCSH:Electronic apparatus and appliances -- Reliability -- Congresses
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LCSH:Electronic apparatus and appliances -- Testing -- Congresses 全ての件名で検索 LCSH:Integrated circuits -- Reliability -- Congresses 全ての件名で検索 LCSH:Integrated circuits -- Testing -- Congresses 全ての件名で検索 |
| ISSN | 07350791 |
| NCID | AA11024425 |