Manual of patent examining procedure
| データ種別 | 電子ジャーナル |
|---|---|
| 出版者 | Washington, D.C. : U.S. Dept. of Commerce, Patent and Trademark Office |
| 雑誌巻号一覧 |
書誌詳細を非表示
| 書誌ID | OJ00152507 |
|---|---|
| 本文言語 | 英語 |
| 別書名 | その他のタイトル:MPEP |
| 変遷注記 | 継続前誌:United States. Patent Office. Manual of patent examining procedure. |
| 一般注記 | Current Publication Frequency:Irregular Began with 4th ed. (1979) Kept up to date with revisions License restrictions may limit access Description based on: 4th ed. (1979); title from PDF title page (HeinOnline, viewed on June 10, 2019) Latest issue consulted: 9th ed. (Jan. 2018) (viewed on June 10, 2019) Available in other form:Manual of patent examining procedure ISSN:0364-2453 |
| 著者標目 | *United States Patent and Trademark Office |
| 件 名 | LCSH:United States Patent and Trademark Office -- Rules and practice
全ての件名で検索
FREE:United States Patent and Trademark Office LCSH:Patent practice -- United States -- Handbooks, manuals, etc 全ての件名で検索 LCSH:Patent laws and legislation -- United States -- Handbooks, manuals, etc 全ての件名で検索 FREE:Patent laws and legislation FREE:Patent practice FREE:United States |
| 資料種別 | 機械可読データファイル |
| XISSN | 03642453 |
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