INSPEC (Information service)
著者名典拠詳細を非表示
| 著者の属性 | 団体 |
|---|---|
| 一般注記 | EMIS datareviews series ; no. 1. Properties of amorphous silicon, c1985: t.p. (INSPEC) verso t.p. (INSPEC, Information Services Division of the Institution of Electrical Engineers) nuc87-101945: Birefringence in crystals ... 1984? (hdg. on FMU rept.: Information Services for the Physics and Engineering Communities; usage: INSPEC) EDSRC:Key abstracts. Electronic circuits(INSPEC, 1975-) |
| 別名 | Institution of Electrical Engineers. Information Services Division Institution of Electrical Engineers. INSPEC |
| コード類 | 典拠ID=AU00085534 NCID=DA01728470 |
| 1 | Key abstracts. Artificial intelligence Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, U.K. : Published by INSPEC, Institution of Electrical Engineers, in association with Institute of Electrical and Electronics Engineers, New York, N.Y. , c1987- |
| 2 | Key abstracts. Robotics & control Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, U.K. : INSPEC, Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers , 1987- |
| 3 | Key abstracts. Power systems and applications Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - London : Published by INSPEC in association with the Institute of Electrical and Electronics Engineers , c1987- |
| 4 | Key abstracts. Optoelectronics Jan. 1987 (Jan. 1987)-. - Hitchin, U.K. : INSPEC, Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers , 1987- |
| 5 | Key abstracts. Antennas & propagation Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, Herts., United Kingdom : INSPEC, The Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers , c1987- |
| 6 | Key abstracts. Telecommunications Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, Herts., U.K. : INSPEC, Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers , c1987- |
| 7 | Key abstracts. Electronic instrumentation Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, U.K. : INSPEC. - New York, N.Y. : Institute of Electrical and Electronics Engineers , c1987- |
| 8 | Key abstracts. Measurements in physics Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, Herts., U.K. : INSPEC, Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers , c1987- |
| 9 | Key abstracts. Computer communications & storage Jan. 1987 (Jan. 1987)-. - Hitchin : INSPEC, Institution of Electrical Engineers , c1987- |
| 10 | Key abstracts. Computing in electronics and power Jan. 1987 (Jan. 1987)-. - Hitchin : INSPEC, Institution of Electrical Engineers , c1987- |
| 11 | Key abstracts. Advanced materials Jan. 1987 (Jan. 1987)-. - Hitchin : INSPEC, Institution of Electrical Engineers , c1987- |
| 12 | Key abstracts. Electronic circuits (1975)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - London : INSPEC , 1975- |
| 13 | Science abstracts. Sect. B, Electrical and electronics abstracts Vol. 69, no. 817 (1966)-v. 94, no. 1128 (Dec. 1991) ; 1992, no. 1 (Jan. 1992)-. - London : Institution of Electrical Engineers , 1966- |
| 14 | Key abstracts. Semiconductor devices Jan. 1987 (Jan. 1987)-Dec. 1989 (Dec. 1989) ; Issue 90/1 (Jan. 1990)-. - Hitchin, Herts., U.K. : INSPEC, Institution of Electrical Engineers. - New York, N.Y. : Institute of Electrical and Electronics Engineers |